Semiconductor microscopy, IBM research. French semiconductor engineer Marilyne Sousa using a transmission electron microscope (TEM) in a noise-free la
Semiconductor microscopy, IBM research. French semiconductor engineer Marilyne Sousa using a transmission electron microscope (TEM) in a noise-free laboratory at the Binnig and Rohrer Nanotechnology Center at IBM Research-Zurich, Switzerland. She is part of the Advanced Functional Materials research group, where she performs structural characterization of thin oxide films and III-V materials for high-mobility channels for technology nodes smaller than 14 nanometres. Photographed in October 2013.
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