. Electron microscopy; proceedings of the Stockholm Conference, September, 1956. Electron microscopy. 12 V. E. COSSLETT AND P. DUNCUMB. Fig. 5. White pearlitic cast-iron. Oj + 0,' magnification: 1000. 14'', 02= 12', with correcting lens, M^l M.,= 3. Exposure time: 3 seconds. Direct blement constante. Elle presente une sensibilite au relief comparable a celle des methodes optiques in- terferentielles ou par contraste de phase, tout en ayant une limite de resolution dix fois meilleure en- viron, dans les conditions actuelles. Ces caracteristi- ques essentielles, fixeront, sans aucun doute. le do
. Electron microscopy; proceedings of the Stockholm Conference, September, 1956. Electron microscopy. 12 V. E. COSSLETT AND P. DUNCUMB. Fig. 5. White pearlitic cast-iron. Oj + 0,' magnification: 1000. 14'', 02= 12', with correcting lens, M^l M.,= 3. Exposure time: 3 seconds. Direct blement constante. Elle presente une sensibilite au relief comparable a celle des methodes optiques in- terferentielles ou par contraste de phase, tout en ayant une limite de resolution dix fois meilleure en- viron, dans les conditions actuelles. Ces caracteristi- ques essentielles, fixeront, sans aucun doute. le domaine propre d'utilisation de la microscopic eiec- tronique par reflexion dans Tobservation directe des surfaces. BiBLIOGRAPHlE 1. VON BoRRiES, B.,Z. Physik 116, 370 (1940). 2. Pert, Ch., Compt. rend. acad. sci. 248, 333 (1954). 3. Pert, Ch. et Marty, B., Compt. rend. acad. scl. 241. 1454 (1955) 4. Pert, Ch., Marty, B. et Laporte, R., Comptes rendus du colloqiie CNRS a Toulouse, Avril 1955. 5. RusKA, E., Z. Pliysik 83, 492 (1933). A Scanning Microscope with either Electron or X-Ray Recording V. E. CossLETT and P. Duncumb Cavendish Laboratory, Cambridge 1 HE purpose of the scanning microscope is to form an image of a surface either by electron scattering or by x-ray emission, and to analyse the elements in a selected volume of about one cubic micron in the surface by the characteristic x-ray lines emitted. A block diagram of the apparatus is shown in lenses into a small spot on the specimen, using a similar technique to the x-ray projection microscope (4, 6), and is scanned over the specimen by the deflec- tion coils. These coils are similar to those used by McMullan and Smith in their scanning electron microscope (5, 7), and give the beam a double deflec- fig. 1. The electron beam is focussed by two magnetic tion balanced so that the beam always goes through. Please note that these images are extracted from scanned page images that may have been digitally enhanced for readabili
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