X-ray materials analysis equipment. This is a Kratos Axis Ultra X-ray photoelectron spectrometer (XPS) instrument. It is used to analyse the surface c

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X-ray materials analysis equipment. This is a Kratos Axis Ultra X-ray photoelectron spectrometer (XPS) instrument. It is used to analyse the surface chemistry of a material. It measures the composition, chemical state and electronic state of elements found within the material. Photographed at the National Physical Laboratory, Teddington, UK.

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Size: 4850px × 3638px
Photo credit: © ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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