. The Bell System technical journal . uits and devices it is necessaryto have analytic expressions for the device characteristics. For smallsignal analysis this is relatively easy. In large signal applications, as inswitching, the situation is not so simple. The problems arise becauseof the high degree of nonlinearity wherein the simplifying assumptionsemployed in small signal analysis are by no means valid. Further, it isdesirable to retain dc terms in many cases. The method to be employed here is the so called broken-line methodwhich involve^ approximating the negative resistance characteris
. The Bell System technical journal . uits and devices it is necessaryto have analytic expressions for the device characteristics. For smallsignal analysis this is relatively easy. In large signal applications, as inswitching, the situation is not so simple. The problems arise becauseof the high degree of nonlinearity wherein the simplifying assumptionsemployed in small signal analysis are by no means valid. Further, it isdesirable to retain dc terms in many cases. The method to be employed here is the so called broken-line methodwhich involve^ approximating the negative resistance characteristic bythree intersecting straight lines. The assumption is made that there arethree distinct regions of operation in each of which the device is sepa-rately linear, but involving different parameter values for each region. The approximation is shown in Fig. 12. The assumption that thenegative resistance characteristic can be simulated by three straightlines is reasonably valid for gross considerations; for fine detail near the <:^. R,N R,N = rb+r- +
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Keywords: ., bookcentury1900, bookdecade1920, booksubjecttechnology, bookyear1
