. The American journal of roentgenology, radium therapy and nuclear medicine . It becomes, therefore, aproblem of great importance in deep x-raytherapy to produce x-rays of short wave-lengths. It has been largely for the pur-pose of calling especial attention to thisfact that I have dwelt so long uponthe elementary problem of deep therapy, -84 The Scientific Basis of Short Wave-Length Therapy before describing our researches in x-rayspectra. 3. The method of measuring the x-raywave-lengths is based upon the researchesof Laue, Friedrich and Knipping, and theBraggs. Figure 2 represents the arran
. The American journal of roentgenology, radium therapy and nuclear medicine . It becomes, therefore, aproblem of great importance in deep x-raytherapy to produce x-rays of short wave-lengths. It has been largely for the pur-pose of calling especial attention to thisfact that I have dwelt so long uponthe elementary problem of deep therapy, -84 The Scientific Basis of Short Wave-Length Therapy before describing our researches in x-rayspectra. 3. The method of measuring the x-raywave-lengths is based upon the researchesof Laue, Friedrich and Knipping, and theBraggs. Figure 2 represents the arrange-ment of the apparatus. A beam of x-rayscoming from the target T passes througha small hole in the brick wall and thenthrough a narrow slit between lead x-ray tube and the generating plantlie in one room and the spectrometer in anadjoining room. The wall between therooms gives good protection to the spectro-meter and the operators against strayradiation from the tube. When highvoltages are used, and, therefore, penetrat-ing radiation, it is advisable to add a. considerable thickness of lead to increasethe protection, as illustrated in the x-rays, after coming through thelead slit, pass through a small crystalmounted on a spectrometer table. Thespectrometer table can be turned throughan\ desired angle, and the position of thecrystal determined by reading the spec-trometer scales. of the x-ray beam isreflected by the atoms in the of certain wave-lengths onlj arereflected at a given angle. By measuringtins angle, the wave-length can be calcu-lated. The reflected beam of rays passesthrough a secoi I ead slit into an ioniza-tion chamber, and the current producedl>\ them is measured by the quadrantelectrometer. We take the current throughthe ionization chambei as an indication of the intensity of the .v-rays having thecalculated wave-length. Figure 3 is a photograph of one of ourx-ray spectrometers. The x-ray tube andgenerating plant are
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