Coloured scanning electron micrograph (SEM) of a sample of titanium silicon nitride. This compound is used as a coating for hard materials. This sampl

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Coloured scanning electron micrograph (SEM) of a sample of titanium silicon nitride. This compound is used as a coating for hard materials. This sample is being prepared for analysis by atom probe tomography, an imaging technique that will show the position of every atom in the sample. The sample has been filed to a fine tip by a focused ion beam.

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Size: 3611px × 4874px
Photo credit: © MICROSCOPY AUSTRALIA, UNIVERSITY OF SYDNEY/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

Keywords: analysis, background, black, chemical, chemistry, compound, elemental, elements, fib, ion, manipulation, material, materials, metal, metallurgy, milling, mineralogy, nitride, sample, science, sem, shaping, silicon, tip, titanium