FE scanning electron microscopy. Researcher operating a field-emission scanning electron microscope (FE-SEM). This is a F JEOL 6320F FE-SEM, equipped
FE scanning electron microscopy. Researcher operating a field-emission scanning electron microscope (FE-SEM). This is a F JEOL 6320F FE-SEM, equipped with a cold field-emission source and in-lens detectors. It is designed to obtain ultra-high resolution analysis of samples at low accelerating voltage. Compositional mapping techniques that can be used include energy dispersive spectroscopy (EDS) and electron back-scattered diffraction (EBSD). Photographed at the Solar Energy Research Facility (SERF), the National Renewable Energy Laboratory (NREL), Golden, Colorado, USA.
Size: 3425px × 2569px
Photo credit: © MIKE LINENBERGER, NREL/US DEPARTMENT OF ENERGY/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No
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