At the NIST Automated Manufacturing Research Facility, (from left) NIST Director John Lyons, Commerce Secretary Robert Mosbacher, and John Simpson, director of the NIST Center for Manufacturing Engineering discuss the potential to improve the quality and productivity of manufacturing operations through the use of a variety of ner automation techniques. During his January 26 visit to the NIST campus in Gaithersburg, MD, Mosbacher also toured the Semiconductor Processing Research Laboratory, where NIST researchers develop the measurement science and technology utilized in the semiconductor

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At the NIST Automated Manufacturing Research Facility, (from left) NIST Director John Lyons, Commerce Secretary Robert Mosbacher, and John Simpson, director of the NIST Center for Manufacturing Engineering discuss the potential to improve the quality and productivity of manufacturing operations through the use of a variety of ner automation techniques. During his January 26 visit to the NIST campus in Gaithersburg, MD, Mosbacher also toured the Semiconductor Processing Research Laboratory, where NIST researchers develop the measurement science and technology utilized in the semiconductor industry.

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