Scanning electron microscope (SEM), computer artwork. An SEM uses an electron beam (vertical yellow line) to obtain a three-dimensional image of an ob

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Scanning electron microscope (SEM), computer artwork. An SEM uses an electron beam (vertical yellow line) to obtain a three-dimensional image of an object at magnifications much higher than can be obtained using light waves. The beam is scanned over the sample (bottom left) in a vacuum, causing the emission of secondary electrons (diagonal yellow line). These secondary electrons are detected and used to form the image, which is displayed here on a screen.

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Size: 4473px × 3933px
Photo credit: © CLAUS LUNAU/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

Keywords: artwork, background, beam, cut, cut-, cut-outs, cutout, cutouts, device, diagram, electron, equipment, illustration, instrument, machine, magnifying, outs, physical, physics, sample, screen, specimen, technological, technology, vacuum, white