SEM specimen drying equipment. Critical-point dryer and freeze-dryer for scanning electron microscope (SEM) specimen preparation. Scanning electron mi

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SEM specimen drying equipment. Critical-point dryer and freeze-dryer for scanning electron microscope (SEM) specimen preparation. Scanning electron microscopes use electrons to view objects at magnifications much higher than can be obtained using light waves. The preparation of the object being scanned often includes stages such as drying the sample. Freezing can be done to obtain freeze-fractured samples to reveal details of internal structures. Photographed in Plymouth, UK.

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Size: 5440px × 3248px
Photo credit: © PETER BOND, EM CENTRE, UNIVERSITY OF PLYMOUTH/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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