Atomic force microscopy. Researcher examining the surface of a CD-ROM (on screen at right) using atomic force microscopy. This technique places a prob

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Atomic force microscopy. Researcher examining the surface of a CD-ROM (on screen at right) using atomic force microscopy. This technique places a probe very close to the surface of the object that is being scanned. Atomic forces between the probe and the surface deflect the probe as it is moved over the surface. The probe used is very small and can 'feel' objects as small as 10 picometres, the size of atoms. CD-ROMs are a type of compact disc (CD), a method of storing data as pits on discs of metal and plastic. The data is read by a laser.

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Photo credit: © PASQUALE SORRENTINO/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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