Ultra-high vacuum atomic force microscope (UHV-AFM). This microscope is used to study the surfaces of objects at an atomic level. An extremely fine sp

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Ultra-high vacuum atomic force microscope (UHV-AFM). This microscope is used to study the surfaces of objects at an atomic level. An extremely fine spring-mounted probe, that is either held in contact with the surface or just above it, slowly moves across the surface. Any deflections are recorded and converted into a computer map of the surface. Placing the object to be studied in a ultra-high vacuum greatly increases the sensitivity of the probe.

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Size: 5440px × 4080px
Photo credit: © ANDREW BROOKES, NATIONAL PHYSICAL LABORATORY/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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