Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever used in atomic force microscopy (AFM). An atomic force microscope

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Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum : x200 when printed at 10 centimetres wide.

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Size: 4728px × 3709px
Photo credit: © EYE OF SCIENCE/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

Keywords: afm, atomic, background, black, cantilever, colored, coloured, equipment, force, microscope, microscopy, physical, physics, probe, rkm, scanning, sem, sfm, spm, technological, technology