Semiconductor silicon wafer defect inspection. Automated optical inspection equipment for semiconductor silicon wafer defects detection. Selective foc

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Semiconductor silicon wafer defect inspection. Automated optical inspection equipment for semiconductor silicon wafer defects detection. Selective focus.

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Photo credit: © genkur / Alamy / Afripics
License: Royalty Free
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Keywords: accuracy, analyzing, automated, check, chip, close-, closeup, computer, control, cpu, defect, detection, development, die, electronic, electronics, equipment, examining, expertise, fabrication, factory, industry, inspection, laboratory, manufacturing, microscope, modern, optical, pattern, process, production, quality, research, semiconductor, silicon, sorting, surface, system, technology, test, testing, uniformity, visual, wafer