Calculating the thicknesses of the constituent layers of a multi-layer sample, ellipsometry, Light scattering system, Synthesis Laboratory, CIC nanoGU

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Calculating the thicknesses of the constituent layers of a multi-layer sample, ellipsometry, Light scattering system, Synthesis Laboratory, CIC nanoGUNE Nanoscience Cooperative Research Center, Donostia, Gipuzkoa, Euskadi, Spain

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Photo credit: © Javier LARREA / Alamy / Afripics
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