Observation of silicon wafer Tencor profilometer Measurement of the refractive index and thickness of monolayers Cleanroom Microelectronics and Mi
Observation of silicon wafer Tencor profilometer Measurement of the refractive index and thickness of monolayers Cleanroom Microelectronics and Microsystems Unit CEIT Center of Studies and Technical Research University of Navarra, Donostia, Gipuzkoa, Basque Country, Spain
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Photo credit: © Javier LARREA / Alamy / Afripics
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