Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An

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Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum : x6600 when printed at 10 centimetres wide.

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Size: 4762px × 3697px
Photo credit: © EYE OF SCIENCE/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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