Image of a silicon wafer circular. FIB, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBeamTM, Nano


Image of a silicon wafer circular. FIB, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBeamTM, Nanofabrication Tool, Nano-scale materials fabrication and manipulation, High-resolution Scanning Electron Microscopy, Nano-structural surface processing and device fabrication, CIC nanoGUNE, Nanoscience Cooperative Research Center, San Sebastian, Donostia, Gipuzkoa, Euskadi, Spain


Size: 4624px × 3745px
Photo credit: © Javier LARREA / Alamy / Afripics
License: Licensed
Model Released: No

Keywords: beam, cic, close-, color, development, donostia, electron, europe, fabrication, focused, gipuzkoa, guipuzcoa, high-resolution, horizontal, image, images, indoors, interior, ion, lab, laboratories, laboratory, labs, materials, microscopy, nanofabrication, nanogune, nanoscience, nanotechnology, people, research, researching, san, scanning, science, screen, screens, sebastian, semiconductor, semiconductors, silicon, spain, technology, wafer, wafers