Damaged MEMS silicon wafer. Coloured scanning electron micrograph of a chipped MEMS (microelectromechanical systems) silicon wafer. MEMS devices are c


Damaged MEMS silicon wafer. Coloured scanning electron micrograph of a chipped MEMS (microelectromechanical systems) silicon wafer. MEMS devices are constructed on a microscopic scale using technologies such as wet and dry etching and thin film deposition. Applications include sensors and optical displays. Materials used to construct MEMS devices include silicon and polymers such as plastics. Magnification: x443, when printed 10 centimetres wide.


Size: 4876px × 3654px
Photo credit: © DAVID SCHARF/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

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