Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBea

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Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBeamTM, Nanofabrication Tool, Nano-scale materials fabrication and manipulation, High-resolution Scanning Electron Microscopy, Nano-structural surface processing and device fabrication, CIC nanoGUNE, Nanoscience Cooperative Research Center, San Sebastian, Donostia, Gipuzkoa, Euskadi, Spain

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Size: 3526px × 5288px
Photo credit: © Javier LARREA / Alamy / Afripics
License: Licensed
Model Released: Yes

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