Scanning electron micrograph showing the twill weave pattern on a silk tie. Magnification: x130 (at 10x8 size).

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Size: 3778px × 5102px
Photo credit: © R.E. LITCHFIELD/SCIENCE PHOTO LIBRARY / Alamy / Afripics
License: Licensed
Model Released: No

Keywords: cloth, clothes, clothing, material, materials, sem, silk, tie