Researcher, Phillips FEI XL30 SFEG Scanning Electron Microscope.

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Researcher, Scanning Electron Microscope SEN, Phillips ips FEI XL-30 FEG (SEM). University Of Berkeley . (MR-321)

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Size: 3972px × 2640px
Location: California, United States
Photo credit: © inga spence / Alamy / Afripics
License: Licensed
Model Released: Yes

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