Transmission electron microscope (TEM), cut-away illustration. A TEM uses an electron beam to obtain an image of an object at a much higher concentrat


Transmission electron microscope (TEM), cut-away illustration. A TEM uses an electron beam to obtain an image of an object at a much higher concentration than can be obtained using light waves. The electrons travel down the microscope column and through the sample forming an image on a fluorescent plate beneath the column.


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Photo credit: © KARL GAFF/SCIENCE PHOTO LIBRARY / Alamy / Afripics
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