Focused-Ion-Beam FIB Nanofabrication Laboratory, Dual-Beam FIB, Helios NanoLabTM DualBeamTM, instrument combines high resolution imaging capabilities
Focused-Ion-Beam FIB Nanofabrication Laboratory, Dual-Beam FIB, Helios NanoLabTM DualBeamTM, instrument combines high resolution imaging capabilities of an advanced SEM with the full set of tools for nano-structuring and nano-manipulation A high-resolution FIB column, advanced gas chemistry and a high precision mechanics of the instrument facilitate a new level in nano-device fabrication and characterization The FIB tool will help to explore new processes for the fabrication of functional nanostructures and nanodevices, complementary to other techniques such as Photo- and Electron-Beam Lithography Nanofabrication Tool, Nano-scale materials fabrication and manipulation, High-resolution Scanning Electron Microscopy, Nano-structural surface processing and device fabrication, CIC nanoGUNE, Nano science Cooperative Research Center, Donostia, San Sebastian, Gipuzkoa, Basque Country, Spain
Size: 6200px × 3958px
Photo credit: © Javier LARREA / Alamy / Afripics
License: Licensed
Model Released: Yes
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